Option
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ESP MCP-TP08P (p/n RMH114)
For non homogeneous samples,
Pin Interval 5mm,
Pin Top ψ2 × 4 pins
Pushing Pressure 240g/Pin
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PSP MCP-TP06P (p/n RMH112)
For small samples,
Pin Pitch 1.5mm,
Pin Points 0.26R × 4 pins
Spring pressure 70g/Pin
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BSP MCP-TP05P(p/n RMH111)
For very large samples,
Pin pitch 2.5mm
Pin points 0.37R × 4pins
Spring pressure 210g/pin
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LSP MCP-TPLSP (p/n RMH116)
For soft surface samples,
Pin pitch 5mm
Pin top hemisphere
2mm × 4pins
Spring pressure 130g/pin
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AP2 MCP-TPAP2 (p/n RMH333)
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BP MCP-TPBP (p/n RMH118)
Resistance by 2 parts: Each part has apin,
In interval free,
Pin top ψ2 × 2 pins
Pushing pressure 240g/Pin
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ASP MCP-TP03P (p/n RMH110)
Standard, Pin Interval 5mm,
Pin Top 0.37R ×4 pins
Pushing Pressure 210g/Pin
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QP2 MCP-TPQP2 (RMH119)
For very small samples,
Pin pitch 1.5mm
Pin points 0.26R × 4pins
Spring pressure 70g/pin
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TFP MCP-TFP (PMJ217)
For thin films on Si Wafer,
Pin pitch 1.0mm
In points ψ0.15 × 4pins
Spring pressure 50g/pin
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NSCP MCP-NSCP (PMJ202)
For Silicon Wafer,
Pin pitch 1.0mm
In points ψ0.04 × 4pins
Spring pressure 250g/pin
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MCP-TRF1 (p/n RMH304)
Linear 4 Pins, 1Ω
For ASP, ESP, LSP Probes
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MCP-TRPS (p/n RMH311)
Linear 4 Pins, 1Ω,
for PSP probe
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MCP-TRT2 (p/n RMH335)
2 Pins, 1Ω,
For AP2 probes
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MCP-TRTF(p/n RMH312)
TFP, NSCP
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MCP-TRQP2 (p/n RMH313)
4 Pins, 1Ω,
For QP2 probes
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