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  Classification >>  Resistivity Meter Series >> Loresta-GX >> 
    Related Product >> 
  Loresta-GX Frequency 21710
Model No: MCP-T700
Product Name: Loresta-GX
Maker: Nittoseiko Analytech
Distributor: South&North International Co., Ltd.
RelateDate

Specification

 MCP-T700 Loresta-GX

Accurate and quick measurement of materials’ resistivity 4 Terminal 4 Pin Method

High accuracy with eliminating contact resistance between sample and probe and lead wire’s resistance

MCP Probes’ spring contact method keeps constant pin pitch, pressure and contact area on samples

低阻抗率計GP MCP-T610型

 

 Standard Configuration

Type of Measurement

MCP-T700 Loresta-GX

Features

Expanded measuring range:0.001×10-4~9.999×107Ω

Operability on 7.5 inch color LCD touch screen

One-touch operation :Automatic measurement with functional Auto-hold and Timer Mode

Silicon Mode for silicon wafer measurement

Low conductive materials are acceptable by Selectable Applied Current Function

Current polarity reversing makes stable measurement

Applications

Conductive paint, Conductive ink, Conductive paste, Resistive paste(carbon etc.), Conductive plastics,

 

 

 

 Standard equipment

 

ASP探頭

ASP MCP-TP03P (p/n RMH110)

Standard, Pin Interval 5mm,

Pin Top 0.37R ×4 pins

Pushing Pressure 210g/Pin

 

 

 

ASP, ESP之探頭檢驗片

MCP-TRF1 (p/n RMH304)

Linear 4 Pins, 1Ω

For ASP, ESP, LSP Probes

 

 

 

 

 Option


 

ESP探頭

ESP MCP-TP08P (p/n RMH114)

For non homogeneous samples,

Pin Interval 5mm,

Pin Top ψ2 × 4 pins

Pushing Pressure 240g/Pin


 

PSP探頭

PSP MCP-TP06P (p/n RMH112)

For small samples,

Pin Pitch 1.5mm,

Pin Points 0.26R × 4 pins

Spring pressure 70g/Pin


 

QPP探頭

QP2 MCP-TPQP2 (RMH119)

For very small samples,

Pin pitch 1.5mm

Pin points 0.26R × 4pins

Spring pressure 70g/pin


 

NSCP探頭

TFP MCP-TFP (PMJ217)

For thin films on Si Wafer,

Pin pitch 1.0mm

In points ψ0.15 × 4pins

Spring pressure 50g/pin


 

NSCP探頭

NSCP MCP-NSCP (PMJ202)

For Silicon Wafer,

Pin pitch 1.0mm

In points ψ0.04 × 4pins

Spring pressure 250g/pin


 

BSP探頭

BSP MCP-TP05P(RMH111)

For very large samples,

Pin pitch 2.5mm

Pin points 0.37R × 4pins

Spring pressure 210g/pin


 

TFP探頭

LSP MCP-TPLSP (RMH116)

For soft surface samples,

Pin pitch 5mm

Pin top hemisphere

2mm × 4pins

Spring pressure 130g/pin


 

A探頭

AP2 MCP-TPAP2 (RMH333)

 


 

B探頭

BP MCP-TPBP (p/n RMH118)

Resistance by 2 parts: Each part has apin,

In interval free,

Pin top ψ2 × 2 pins

Pushing pressure 240g/Pin


 

PSP之探頭檢驗片

MCP-TRPS (p/n RMH311)

Linear 4 Pins, 1Ω,

for PSP probe


 

TFP, NSCP之探頭檢驗片

MCP-TRTF (p/n RMH312)

TFP, NSCP


 

TFP, NSCP之探頭檢驗片

MCP-TRT2 (p/n RMH335)

2 Pins, 1Ω,

For AP2 probes


 

TFP, NSCP之探頭檢驗片

MCP-TRQP2 (p/n RMH313)

4 Pins, 1Ω,

For QP2 probes


 

腳踏開關

MCP-FS02 (p/n RMJ802)


 

絕緣板UFL

MCP-ST03 (p/n RMJ354) UFL

300W×200L×10Hmm

Probe should be placed perpendicularly on samples.


 

 
Notation



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