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  Classification >>  Resistivity Meter Series >> Loresta-AX >> 
    Related Product >> 
  Loresta-AX Frequency 23938
Model No: MCP-T370
Product Name: Loresta-AX
Maker: Nittoseiko Analytech
Distributor: South&North International Co., Ltd.
RelateDate

Specification

 MCP-T370 Loresta-AX

4 Terminal 4 Pin Method

The contact resistance between sample and probe is excluded. Accurate measurement is realized by this method.

Pin pressure, pin interval and pin diameter are maintained constant by using the MCP probe which adopted the spring contact mechanism.

 

 Standard Configuration

Type of Measurement

MCP-T370 Loresta-AX

 

Features

Measurement can be done automatically in “Auto Hold” mode by just pushing the Start key.

The Nickle Hydrogen Battery is adopted to the system. Portable operation is possible. The battery pack can be changed by very easy operation.

Probe check Mode on the software was adopted. The accuracy of the Loresta-AX main unit and the probe can be checked by using the Probe Checker(not included in the standard set).

Measurement data can be output to USB memory.

 

Range

10-2~106Ω

 

Data Output

USB Memory

 

Dimention&Weight

228 L× 85 W× 65 Hmm, 420g

 

 

 

 

 

 Standard equipment

 

 

ASP探頭

ASP MCP-TP03P (p/n RMH110)

Standard, Pin Interval 5mm,

Pin Top 0.37R ×4 pins

Pushing Pressure 210g/Pin

 

 

 

MCP-TA06 Adaptar

 

 

 

 

 Option


 

ESP探頭

ESP MCP-TP08P (p/n RMH114)

For non homogeneous samples,

Pin Interval 5mm,

Pin Top ψ2 × 4 pins

Pushing Pressure 240g/Pin


 

PSP探頭

PSP MCP-TP06P (p/n RMH112)

For small samples,

Pin Pitch 1.5mm,

Pin Points 0.26R × 4 pins

Spring pressure 70g/Pin


 

BSP探頭

BSP MCP-TP05P(p/n RMH111)

For very large samples,

Pin pitch 2.5mm

Pin points 0.37R × 4pins

Spring pressure 210g/pin


 

TFP探頭

 

LSP MCP-TPLSP (p/n RMH116)

For soft surface samples,

Pin pitch 5mm

Pin top hemisphere

2mm × 4pins

Spring pressure 130g/pin


 

A探頭

AP2 MCP-TPAP2 (p/n RMH333)

 


 

B探頭

BP MCP-TPBP (p/n RMH118)

Resistance by 2 parts: Each part has apin,

In interval free,

Pin top ψ2 × 2 pins

Pushing pressure 240g/Pin


 

B探頭

ASP MCP-TP03P (p/n RMH110)

Standard, Pin Interval 5mm,

Pin Top 0.37R ×4 pins

Pushing Pressure 210g/Pin


 

B探頭

QP2 MCP-TPQP2 (RMH119)

For very small samples,

Pin pitch 1.5mm

Pin points 0.26R × 4pins

Spring pressure 70g/pin


 

B探頭

TFP MCP-TFP (PMJ217)

For thin films on Si Wafer,

Pin pitch 1.0mm

In points ψ0.15 × 4pins

Spring pressure 50g/pin


 

B探頭

NSCP MCP-NSCP (PMJ202)

For Silicon Wafer,

Pin pitch 1.0mm

In points ψ0.04 × 4pins

Spring pressure 250g/pin


 

ESP探頭

MCP-TRF1 (p/n RMH304)

Linear 4 Pins, 1Ω

For ASP, ESP, LSP Probes


 

PSP之探頭檢驗片

MCP-TRPS (p/n RMH311)

Linear 4 Pins, 1Ω,

for PSP probe


 

TFP, NSCP之探頭檢驗片

MCP-TRT2 (p/n RMH335)

2 Pins, 1Ω,

For AP2 probes


 

TFP, NSCP之探頭檢驗片

MCP-TRTF(p/n RMH312)

TFP, NSCP


 

TFP, NSCP之探頭檢驗片

MCP-TRQP2 (p/n RMH313)

4 Pins, 1Ω,

For QP2 probes


 

 
Notation



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